Advanced electron microscopy has evolved into a suite of complementary methods that deliver structural, chemical and functional insight at the atomic scale. Aberration correction and monochromation of ...

Electron diffraction is a powerful analytical technique used to study the atomic structure of materials. It involves the interaction of a beam of electrons with a crystalline sample, resulting in a ...

Last November, Quantum Design and NanoMEGAS invited industry and research professionals to learn more about the theoretical and practical applications of Precession Electron Diffraction (PED).

Modern energy technologies are essential for meeting the growing global demand for electricity, driven by rapid industrialization and the global transition toward renewable energy. Among these ...

Layered LiCoO₂ and corresponding SNED diffraction pattern highlighting atomic structure and interfacial phase transitions. Ishikawa, Japan-- Modern energy technologies are essential for meeting the ...

With the demand for high-performnce materials increasing, it has become necessary to optimize their structural properties at the nanoscale, underscoring the importance of systematic and routine ...

During chemical reactions, atoms in the reacting substances break their bonds and re-arrange, forming different chemical products. This process entails the movement of both electrons (i.e., negatively ...

(Nanowerk News) Metal-Organic Frameworks (MOFs) are porous crystalline materials whose structure resembles a scaffold of beams around a large empty space; this internal space can be used to store ...

Could you start by explaining your background in crystallography and how you began using the Rigaku Synergy-ED system? Fraser: I began my journey into crystallography at the University of Edinburgh in ...

Back in 2010, crystallographer Tim Gruene heard a scientist from drugmaker Novartis say something that stuck with him. The pharmaceutical giant had amassed a collection of around 2 million small ...

Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.